AC RTN: Testing, Modeling, and Prediction
نویسندگان
چکیده
Random telegraph noise (RTN) adversely induces time dependent device-to-device variations and requires modeling to optimize circuit design. Many early works were focused under dc test conditions, although digital circuits typically operate ac conditions it has been reported that RTN is substantially different from RTN. Tests on carried out mainly individual traps, a reliable statistical distribution of trap constants for still missing. This prevents verifying the accuracy Monte Carlo simulation based compact models, especially in terms their ability predict as window increases. Recently, an integral methodology proposed RTN, which can not only model at short but also long time. By introducing concept effective charged need removed, making prediction similar aging prediction. The objectives this work are report experimental data applicability them. For first time, will be shown extracted 7.8 s used long-term ( $3\times 10^{{4}}$ s) dependence frequency analyzed, contributions carrier tunneling gate substrate assessed.
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ژورنال
عنوان ژورنال: IEEE Transactions on Electron Devices
سال: 2022
ISSN: ['0018-9383', '1557-9646']
DOI: https://doi.org/10.1109/ted.2022.3195690